 Shanghai South Ocean Electron Co.,LTD. |
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中文 English |
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Shanghai South Ocean Electron Co.,LTD. |
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2.Test procedures |
2.Test procedures2.1 Typical Qualification Tests for Quartz Crystals |
| TEST TYPE | TEST METHOD | TEST CONDITION |
| Electrical Characteristics | Internal Specification | Per Specification |
| Frequency vs. Temperature | Internal Specification | Per Specification |
| Mechanical Shock | MIL-STD-202, Method 213, C | 100 g's |
| Vibration | MIL-STD-202, Method 204 | 10 g's from 10 - 2000 Hz |
| Thermal Cycle | MIL-STD-202, Method 107, B | -55°C to +125°C, 15 Min Dwell, 10 Cycles |
| Aging | Internal Specification | 168 Hours at 105°C |
| Gross Leak | MIL-STD-202, Method 112, D | 30 Second Immersion, No Bubble Stream |
| Fine Leak | MIL-STD-202, Method 112, C | Must Meet 1x10-8 atm-cm3/sec Max. |
| Solderability | MIL-STD-202, Method 208 | 8 Hour Steam Age, Must Exhibit 95% Coverage |
| Resistance to Solvents | MIL-STD-202, Method 215, C | Three 1 Minute Soaks |
| Terminal Pull | MIL-STD-202, Method 211, A | Wires - 2 Pounds, Pins - 4 Pounds |
| Terminal Bend | MIL-STD-202, Method 211, B | 2 bending Cycles |
| Wire-Lead Bend | MIL-STD-202, Method 211, C | 1 Pound, 3 Bends per Lead |
| Physical Dimension | Internal Specification | Per Specification |
| Internal Visual | Internal Specification | Per Internal Specification |
2.1 Typical Qualification Tests for Crystal Oscillators |
| TEST TYPE | TEST METHOD | TEST CONDITION |
| Electrical Characteristics | Internal Specification | Per Specification |
| Frequency vs. Temperature | Internal Specification | Per Specification |
| Mechanical Shock | MIL-STD-202, Method 213 | 100 g's |
| Vibration | MIL-STD-883, Method 2007, A | 20 g's Peak to Peak from 10 - 2000 Hz sweep |
| Thermal Cycle | MIL-STD-883, Method 1011, B | -55°C to +125°C, 15 Min Dwell, 10 Cycles |
| Aging | Internal Specification | 168 Hours at 105°C |
| Gross Leak | MIL-STD-202, Method 112, D | 30 Second Immersion, No Bubble Stream |
| Fine Leak | MIL-STD-202, Method 112, C | Must Meet 2x10-8 atm-cm3/sec Max. |
| Solderability | MIL-STD-883, Method 2003 | 8 Hour Steam Age, Must Exhibit 95% Coverage |
| Resistance to Solvents | MIL-STD-883, Method 2015 | Three 1 Minute Soaks |
| Terminal Pull | MIL-STD-883, Method 2004, A | 2 Pounds |
| Lead Bend | MIL-STD-883, Method 2004, B1 | 1 bending Cycles |
| Physical Dimension | Internal Specification | Per Specification |
| Internal Visual | Internal Specification | Per Internal Specification |
| Soldering Conditions | Pin Thru Packages
Surface Mount Devices |
260ºC, for 10s, Max.
260ºC, for 10s, Max. or 230ºC, for 90s, Max. |
2.3 Oscillators Electrical Test CircuitsTTL Test Circuit
HCMOS Test Circuit
ECL Test Circuit
PECL Test Circuit
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2.Test procedures |
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Address:No.20,
Lane 291, Jiangchuan Rd., Minhang, Shanghai, China
Telephone:86-21-64353087 
Fax:86-21-64359003
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